Jonas Skovlund Madsen
Jonas Skovlund Madsen
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Plasmonic color metasurfaces fabricated by a high speed roll-to-roll method
S Murthy, H Pranov, NA Feidenhans, JS Madsen, PE Hansen, ...
Nanoscale 9 (37), 14280-14287, 2017
In-line characterization of nanostructured mass-produced polymer components using scatterometry
JS Madsen, LH Thamdrup, I Czolkos, PE Hansen, A Johansson, ...
Journal of Micromechanics and Microengineering 27 (8), 085004, 2017
Scatterometry for optimization of injection molded nanostructures at the fabrication line
JS Madsen, SA Jensen, L Nakotte, A Vogelsang, LH Thamdrup, I Czolkos, ...
The International Journal of Advanced Manufacturing Technology 99 (9-12 …, 2018
Replacing libraries in scatterometry
JSM Madsen, SA Jensen, J Nygård, PE Hansen
Optics Express 26 (26), 34622-34632, 2018
Study on microgratings using imaging, spectroscopic, and fourier lens scatterometry
JS Madsen, PE Hansen, P Boher, D Dwarakanath, JF Jørgensen, ...
Journal of Micro and Nano-manufacturing 5 (3), 2017
Thickness and refractive index analysis of ellipsometry data of ultra-thin semi-transparent films
PE Hansen, JS Madsen
Laser Applications to Chemical, Security and Environmental Analysis, JM4A. 24, 2018
Optical metrology for nanowires grown with molecular beam epitaxy
JSM Madsen, SA Jensen, T Kanne, J Nygård, PE Hansen
Quantum Dots, Nanostructures, and Quantum Materials: Growth …, 2020
Survey of Models for Acquiring the Optical Properties of Translucent Materials
JR Frisvad, SA Jensen, JS Madsen, A Correia, L Yang, SKS Gregersen, ...
STAR 39 (2), 2020
Extending Scatterometry to emerging Industrial Sectors
JSM Madsen
Niels Bohr Institute, Faculty of Science, University of Copenhagen, 2019
The effect of surface and substrate roughness on scatterometry
PE Hansen, J Madsen, S Jensen, M Karamehmedovic
European Optical Society Biennial Meeting 2018, 2018
Modeling surface imperfections in thin films and nanostructured surfaces
PE Hansen, JS Madsen, SA Jensen, MH Madsen, M Karamehmedovic
Modeling Aspects in Optical Metrology VI 10330, 103300J, 2017
Measuring multiple nano-textured areas simultaneously with imaging scatterometry
JS Madsen, PE Hansen, B Bilenberg, J Nygård, MH Madsen
16th International Conference of the European Society for Precision …, 2017
User-friendly Scatterometry
MH Madsen, JS Madsen, B Bilenberg, D Dwarakanath, JF Jørgensen, ...
European Optical Society Annual Meeting, Berlin, Germany, 2016
Exploring the capabilities of the imaging scatterometry technique
JS Madsen
Exploring the Capabilities of the Imaging Scatterometry Technique: Measuring Nanostructures with Visible Light
JS Madsen
Niels Bohr Institute, Copenhagen University, 2016
euspen’s 16 th International Conference & Exhibition, Nottingham, UK, May 2016
SZ Chavoshi, X Luo
Characterization of nano-structured plastic using scatterometry
JS Madsen, M Calaon, PE Hansen, B Bilenberg, A Johansson, G Tosello, ...
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