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Adam Duncan
Adam Duncan
NSWC Crane
Verified email at indiana.edu
Title
Cited by
Cited by
Year
Soft errors induced by high-energy electrons
MJ Gadlage, AH Roach, AR Duncan, AM Williams, DP Bossev, MJ Kay
IEEE Transactions on Device and Materials Reliability 17 (1), 157-162, 2016
722016
Electron-induced single-event upsets in 45-nm and 28-nm bulk CMOS SRAM-based FPGAs operating at nominal voltage
MJ Gadlage, AH Roach, AR Duncan, MW Savage, MJ Kay
IEEE Transactions on Nuclear Science 62 (6), 2717-2724, 2015
512015
Single-event mitigation in combinational logic using targeted data path hardening
V Srinivasan, AL Sternberg, AR Duncan, WH Robinson, BL Bhuva, ...
IEEE transactions on nuclear science 52 (6), 2516-2523, 2005
462005
FPGA bitstream security: a day in the life
A Duncan, F Rahman, A Lukefahr, F Farahmandi, M Tehranipoor
2019 IEEE International Test Conference (ITC), 1-10, 2019
332019
Effect of accumulated charge on the total ionizing dose response of a NAND flash memory
MJ Kay, MJ Gadlage, AR Duncan, D Ingalls, A Howard, TR Oldham
IEEE Transactions on Nuclear Science 59 (6), 2945-2951, 2012
272012
DUT continuity test with only digital IO structures apparatus and methods associated thereof
A Duncan, M Gadlage
US Patent 9,684,025, 2017
222017
Multiple-cell upsets induced by single high-energy electrons
MJ Gadlage, AH Roach, AR Duncan, AM Williams, DP Bossev, MJ Kay
IEEE Transactions on Nuclear Science 65 (1), 211-216, 2017
202017
Leakage current degradation of gallium nitride transistors due to heavy ion tests
BD Olson, JD Ingalls, CH Rice, CC Hedge, PL Cole, AR Duncan, ...
2015 IEEE Radiation Effects Data Workshop (REDW), 1-10, 2015
202015
Simulation study on the effect of multiple node charge collection on error cross-section in CMOS sequential logic
MC Casey, AR Duncan, BL Bhuva, WH Robinson, LW Massengill
IEEE Transactions on Nuclear Science 55 (6), 3136-3140, 2008
182008
Interrupted PROGRAM and ERASE operations for characterizing radiation effects in commercial NAND flash memories
AH Roach, MJ Gadlage, AR Duncan, JD Ingalls, MJ Kay
IEEE Transactions on Nuclear Science 62 (6), 2390-2397, 2015
172015
Impact of X-ray exposure on a triple-level-cell NAND flash
MJ Gadlage, MJ Kay, JD Ingalls, AR Duncan, SA Ashley
IEEE Transactions on Nuclear Science 60 (6), 4533-4539, 2013
172013
Repurposing SoC analog circuitry for additional COTS hardware security
A Duncan, L Jiang, M Swany
2018 IEEE International Symposium on Hardware Oriented Security and Trust …, 2018
132018
Characterizing radiation and stress-induced degradation in an embedded split-gate NOR flash memory
AR Duncan, MJ Gadlage, AH Roach, MJ Kay
IEEE Transactions on Nuclear Science 63 (2), 1276-1283, 2016
132016
Preliminary radiation testing of a state-of-the-art commercial 14nm cmos processor/system-on-a-chip
CM Szabo, A Duncan, KA LaBel, M Kay, P Bruner, M Krzesniak, L Dong
2015 IEEE Radiation Effects Data Workshop (REDW), 1-8, 2015
122015
Impact of neutron-induced displacement damage on the multiple bit upset sensitivity of a bulk CMOS SRAM
MJ Gadlage, MJ Kay, AR Duncan, MW Savage, JD Ingalls, ...
IEEE Transactions on Nuclear Science 59 (6), 2722-2728, 2012
122012
FLATS: filling logic and testing spatially for FPGA authentication and tamper detection
A Duncan, G Skipper, A Stern, A Nahiyan, F Rahman, A Lukefahr, ...
2019 IEEE international symposium on hardware oriented security and trust …, 2019
92019
Using charge accumulation to improve the radiation tolerance of multi-Gb NAND flash memories
MJ Kay, MJ Gadlage, AR Duncan, JD Ingalls, MW Savage
IEEE Transactions on Nuclear Science 60 (6), 4214-4219, 2013
92013
Combination metal oxide semi-conductor field effect transistor (MOSFET) and junction field effect transistor (JFET) operable for modulating current voltage response or …
JL Titus, M Savage, PL Cole, AR Duncan
US Patent 9,595,519, 2017
82017
Digital test system
M Gadlage, A Duncan
US Patent 9,431,133, 2016
82016
Extreme value analysis in flash memories for dosimetry applications
MW Savage, MJ Gadlage, M Kay, JD Ingalls, A Duncan
IEEE Transactions on Nuclear Science 60 (6), 4275-4280, 2013
82013
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