Kwame Osei Boateng

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Medforfattere

Hiroshi TakahashiProfessor, Ehiem UNiversityVerificeret mail på cs.ehime-u.ac.jp
Henry Nunoo-MensahKwame Nkrumah University of Science and TechnologyVerificeret mail på knust.edu.gh
Julius AzasooUniversity of NorthamptonVerificeret mail på northampton.ac.uk
Francis Kwabena Oduro-GyimahLecturer, Ghana Communication Technology UniversityVerificeret mail på gctu.edu.gh
Ing. Dr. Benjamin Asubam WeyoriComputer and Electrical Engineering Department, University of Energy and Natural Resources, SunyaniVerificeret mail på uenr.edu.gh
Eliel KeelsonComputer Engineering, Kwame Nkrumah University of Science and TechnologyVerificeret mail på knust.edu.gh
Kewal SalujaProfessor of Electrical and Computer Engineering, University of Wisconsin - MadisonVerificeret mail på ece.wisc.edu
David Sanka LaarCK Tedam University of Technology and Applied SciencesVerificeret mail på cktutas.edu.gh
Emmanuel Kofi AkowuahKwame Nkrumah University of Science and TechnologyVerificeret mail på knust.edu.gh
Eric KuadaGIMPAVerificeret mail på gimpa.edu.gh
Michael Opoku AgyemanProf. in Computer Engineering, University of NorthamptonVerificeret mail på northampton.ac.uk
Kingsley Nketia AcheampongNatWest GroupVerificeret mail på natwest.com
Griffith Selorm Klogo, PhDKwame Nkrumah University of Science and TechnologyVerificeret mail på knust.edu.gh
Kusi Ankrah BonsuSunyani Technical UniversityVerificeret mail på stu.edu.gh
Prof. Baagyere Edward Yellakour ( PhD)C. K. Tedam University of Technology and Applied SciencesVerificeret mail på cktutas.edu.gh

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Kwame Osei Boateng

Department of Computer Engineering, Kwame Nkrumah University of Science and Technology

Verificeret mail på knust.edu.gh

Test and diagnosis of VLSI and logic circuits residual number system application sensor networks image processing network se


Titel Sortér efter henvisninger Sortér efter årstal Sortér efter titel	Citeret af Citeret af	År
BIST-aided scan test-A new method for test cost reduction T Hiraide, KO Boateng, H Konishi, K Itaya, M Emori, H Yamanaka, ... Proceedings. 21st VLSI Test Symposium, 2003., 359-364, 2003	82	2003
On diagnosing multiple stuck-at faults using multiple and single fault simulation in combinational circuits H Takahashi, KO Boateng, KK Saluja, Y Takamatsu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2002	82	2002
Improving the Effectiveness of the Median Filter KO Boateng, BW Asubam, DS Laar International Journal of Electronics and Communication Engineering 5 (1), 85-97, 2012	62	2012
A retrofit design science methodology for smart metering design in developing countries JQ Azasoo, KO Boateng 2015 15th International Conference on Computational Science and Its …, 2015	40	2015
A method of static compaction of test stimuli KO Boateng, H Konishi, T Nakata Proceedings of 10th AsianTest Symposium, 137-142, 2001	27	2001
The adoption of socio‐and bio‐inspired algorithms for trust models in wireless sensor networks: A survey H Nunoo‐Mensah, KO Boateng, JD Gadze International journal of communication systems 31 (7), e3444, 2018	25	2018
A Smart Retrofitted Meter for Developing Countries E. Keelson, K. O. Boateng, I. Ghansah International Journal of Computer Applications 90 (5), 40-46, 2014	17	2014
Smart Metering: A GSM Approach in Ghana JQ Azasoo, KO Boateng 2012 IEEE 4th International Conference on Adaptive Science and Technology …, 2012	17	2012
A new method for diagnosing multiple stuck-at faults using multiple and single fault simulations H Takahashi, KO Boateng, Y Takamatsu Proceedings 17th IEEE VLSI Test Symposium (Cat. No. PR00146), 64-69, 1999	15	1999
Profitability of listed Ghanaian banks determined by the stylized facts JK Tuffour, PA Owusu, KO Boateng The International Journal of Applied Economics and Finance 12 (1), 1-8, 2018	13	2018
Tamper‐aware authentication framework for wireless sensor networks H Nunoo‐Mensah, KO Boateng, JD Gadze IET Wireless Sensor Systems 7 (3), 73-81, 2017	13	2017
A method of generating tests for marginal delays and delay faults in combinational circuits H Takahashi, T Matsunaga, KO Boateng, Y Takamatsu Proceedings Sixth Asian Test Symposium (ATS'97), 320-325, 1997	13	1997
Multiple gate delay fault diagnosis using test-pairs for marginal delays KO Boateng, H Takahashi, Y Takamatsu IEICE TRANSACTIONS on Information and Systems 81 (7), 706-715, 1998	11	1998
PSTRM: Privacy-aware sociopsychological trust and reputation model for wireless sensor networks H Nunoo-Mensah, KO Boateng, JD Gadze Peer-to-Peer Networking and Applications 13, 1505-1525, 2020	10	2020
Comparative analysis of energy usage of hash functions in secured wireless sensor networks H Nunoo-Mensah, KO Boateng, JD Gadze International Journal of Computer Applications 109 (11), 20-23, 2015	9	2015
Apparatus and method for test-stimuli compaction KO Boateng US Patent 7,260,793, 2007	9	2007
Device and method for testing phase-locked loops KO Boateng US Patent 6,642,701, 2003	9	2003
Diagnosis of single gate delay faults in combinational circuits using delay fault simulation H Takahashi, KO Boateng, Y Takamatsu Proceedings Seventh Asian Test Symposium (ATS'98)(Cat. No. 98TB100259), 108-112, 1998	9	1998
A review of opensource network access control (NAC) tools for enterprise educational networks H Nunoo-Mensah, EK Akowuah, KO Boateng International Journal of Computer Applications 106 (6), 2014	8	2014
A Smith-Waterman Algorithm Accelerator Based on Residue Number System KO Boateng, EY Baagyere International Journal of Electronics and Communication Engineering 5 (1), 99-112, 2012	8	2012

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