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Manashee Adhikary
Manashee Adhikary
Vrije Universiteit Amsterdam, Advanced Research Center for Nano Lithography (ARCNL)
Verified email at arcnl.nl
Title
Cited by
Cited by
Year
Spatially shaping waves to penetrate deep inside a forbidden gap
R Uppu, M Adhikary, CAM Harteveld, WL Vos
Physical review letters 126 (17), 177402, 2021
162021
Experimental probe of a complete 3D photonic band gap
M Adhikary, R Uppu, CAM Harteveld, DA Grishina, WL Vos
Optics express 28 (3), 2683-2698, 2020
162020
Pupil apodization in digital holographic microscopy for reduction of coherent imaging effects
C Messinis, M Adhikary, T Cromwijk, TTM van Schaijk, S Witte, JF de Boer, ...
Optics Continuum 1 (5), 1202-1217, 2022
62022
Field-position dependent apodization in dark-field digital holographic microscopy for semiconductor metrology
T van Gardingen-Cromwijk, M Adhikary, C Messinis, S Konijnenberg, ...
Optics Express 31 (1), 411-425, 2023
32023
Illumination spot profile correction in digital holographic microscopy for overlay metrology
M Adhikary, T van Gardingen-Cromwijk, J De Wit, S Witte, JF De Boer, ...
Journal of Micro/Nanopatterning, Materials, and Metrology 22 (2), 024001-024001, 2023
12023
Analyzing Dominant 13.5 and 27 day Periods of Solar Terrestrial Interaction: A New Insight into Solar Cycle Activities
R Syiemlieh, M Adhikary, PK Panigrahi, E Saikia
Research in Astronomy and Astrophysics 22 (8), 085005, 2022
12022
Controlled light propagation in random, periodic, and superperiodic silicon nanophotonic materials
M Adhikary
12021
An optical probe of a 3D photonic band gap
M Adhikary, R Uppu, CAM Harteveld, WL Vos
The European Conference on Lasers and Electro-Optics, ck_p_15, 2019
12019
Non-isoplanatic lens aberration correction in dark-field digital holographic microscopy for semiconductor metrology
T van Gardingen-Cromwijk, S Konijnenberg, W Coene, M Adhikary, ...
Light: Advanced Manufacturing 4 (4), 453-465, 2024
2024
Robust semiconductor overlay metrology with non-uniform illumination beams using digital holographic microscopy
M Adhikary, T Cromwijk, S Witte, JF de Boer, A den Boef
Optical Measurement Systems for Industrial Inspection XIII 12618, 236-240, 2023
2023
Non-isoplanatic lens aberration corrections in digital holographic microscopy
T Cromwijk, M Adhikary, S Konijnenberg, W Coene, T Tukker, J de Boer, ...
Optical Measurement Systems for Industrial Inspection XIII 12618, 247-250, 2023
2023
Digital image correction methods using dark-field digital holographic microscopy for semiconductor metrology
M Adhikary, T Cromwijk, S Konijnenberg, W Coene, S Witte, J de Boer, ...
Computational Optical Sensing and Imaging, CM3B. 5, 2023
2023
Observation of light propagation through a three-dimensional cavity superlattice in a 3D photonic band gap
M Adhikary, M Kozon, R Uppu, WL Vos
arXiv preprint arXiv:2303.16018, 2023
2023
Spatially Shaping Waves to Penetrate Deep Into the Forbidden Gap of Photonic Crystals
M Adhikary, TJ Vreman, M Kozon, CAM Harteveld, A Lagendijk, R Uppu, ...
PECS-XIII: The 13th International Symposium on Photonic and Electromagnetic …, 2023
2023
Improving the precision of semiconductor overlay measurements using dark-field digital holographic microscopy
M Adhikary, T Cromwijk, C Messinis, J de Wit, S Konijnenberg, S Witte, ...
Imaging Systems and Applications, JTh2A. 8, 2022
2022
Wavefront shaping to optimize the reflectivity in and across a 3D photonic band gap
T Vreman, M Adhikary, CAM Harteveld, A Lagendijk, WL Vos
2022
Light transport by a 3D cavity superlattice in a photonic band gap
M Adhikary, M Kozon, R Uppu, CAM Harteveld, WL Vos
The European Conference on Lasers and Electro-Optics, ck_7_4, 2021
2021
Optical resonances in a 3D superlattice of photonic band gap cavities
M Adhikary, R Uppu, SA Hack, CAM Harteveld, WL Vos
2019 Conference on Lasers and Electro-Optics Europe & European Quantum …, 2019
2019
Solar wind and Sunspot variability in the 23 rd and 24 th solar cycles: A comparative analysis
M Adhikary, PK Panigrahi
Student Journal of Physics 6 (2), 83-94, 2017
2017
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Articles 1–19