| On the electrochemical migration mechanism of tin in electronics D Minzari, MS Jellesen, P Møller, R Ambat Corrosion Science 53 (10), 3366-3379, 2011 | 131 | 2011 |
| Testing procedure for the single fiber fragmentation test S Feih, K Wonsyld, D Minzari, P Westermann, H Lilholt Risoe National Laboratory, Roskilde, Denmark, 1-30, 2004 | 121 | 2004 |
| Corrosion failure due to flux residues in an electronic add-on device MS Jellesen, D Minzari, U Rathinavelu, P Møller, R Ambat Engineering Failure Analysis 17 (6), 1263-1272, 2010 | 87 | 2010 |
| Electrochemical migration on electronic chip resistors in chloride environments D Minzari, MS Jellesen, P Moller, P Wahlberg, R Ambat IEEE Transactions on device and materials reliability 9 (3), 392-402, 2009 | 87 | 2009 |
| Electrochemical migration of tin in electronics and microstructure of the dendrites D Minzari, FB Grumsen, MS Jellesen, P Møller, R Ambat Corrosion Science 53 (5), 1659-1669, 2011 | 81 | 2011 |
| Morphological study of silver corrosion in highly aggressive sulfur environments D Minzari, MS Jellesen, P Møller, R Ambat Engineering failure analysis 18 (8), 2126-2136, 2011 | 41 | 2011 |
| Investigation of electronic corrosion at device level MS Jellesen, D Minzari, U Rathinavelu, P Møller, R Ambat ECS Transactions 25 (30), 1-14, 2010 | 38 | 2010 |
| Solder flux residues and electrochemical migration failures of electronic devices R Ambat, MS Jellesen, D MiNZARI, U Rathinavelu, MAK Johnsen, ... Proceedings of the Eurocorr, 6, 2009 | 28 | 2009 |
| Investigation of electronic corrosion mechanisms D Minzari Technical University of Denmark, 2010 | 23 | 2010 |
| Surface oxide formation during corona discharge treatment of AA 1050 aluminium surfaces D Minzari, P Møller, P Kingshott, LH Christensen, R Ambat Corrosion Science 50 (5), 1321-1330, 2008 | 20 | 2008 |
| Smart plastic functionalization by nanoimprint and injection molding M Zalkovskij, LH Thamdrup, K Smistrup, T Andén, AC Johansson, ... Alternative lithographic technologies vii 9423, 169-174, 2015 | 14 | 2015 |
| Establishing a testing procedure for the single fiber fragmentation test S Feih, K Wonsyld, D Minzari, P Westermann, H Lilholt Riso National Laboratory. Pitney Bowes, Denmark, 2004 | 12 | 2004 |
| Corrosion in electronics at device level MS Jellesen, D Minzari, U Rathinavelu, P Mo̸ller, R Ambat ECS Transactions 25 (30), 1, 2010 | 9 | 2010 |
| Testing Procedure for Single Fibre Fragmentation Test 2004 S Feih, K Wonsyld, D Minzari, P Westermann, H Lilholt Risø National Laboratory: Roskilde, Denmark, 1-28, 0 | 7 | |
| Corrosion in electronics MS Jellesen, D Minzari, P Møller, R Ambat Eurocorr Conference, Edinburgh, Scotland, 7-11, 2008 | 5 | 2008 |
| Testing procedure for the single fiber fragmentation test, Rise National Laboratory S Feih, K Wonsyld, D Minzari, P Westermann, H Lilholt | 4 | 2017 |
| Process, kit and composition for detecting residues and contaminants in an object with three-dimensional geometry D Minzari, MS Jellesen, R Ambat, P Møller, PJS Westermann WO Patent 2,011,048,001, 2011 | 4 | 2011 |
| Electrolytic cip-cleaning process for removing impurities from the inner surface of a metallic container P Moeller, JS Hansen, D Minzari US Patent App. 13/778,940, 2013 | 1 | 2013 |
| Smart plastic functionalization by nanoimprint and injection molding SPIE Advanced Lithography 9423 (Proc. SPIE 9423), 2015 | | 2015 |
| Electrolytic CIP-Cleaning Process for Removing Impurities from the Inner Surface of a Metallic Container P Moeller, JS Hansen, D Minzari US Patent App. 14/223,177, 2014 | | 2014 |
