Vasileios Tenentes

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Daniele RossiUniversity of Pisa, ItalyBekræftet mail på unipi.it
Bashir M. Al-HashimiProfessor of Computer Engineering, King’s College LondonBekræftet mail på kcl.ac.uk
S KhursheedLecturer (Assistant Professor), University of Liverpool, UKBekræftet mail på liv.ac.uk
Xrysovalantis KavousianosUniversity of IoanninaBekræftet mail på cs.uoi.gr
yang shengPhD of electronics engineering, University of SouthamptonBekræftet mail på worldprogramming.com
Emmanouil KalligerosAssistant Professor, Information and Communication Systems Engineering Dept., Univ. of the AegeanBekræftet mail på aegean.gr
Krishnendu ChakrabartyFulton Professor of Microelectronics, School of Electrical and Computer and Energy EngineeringBekræftet mail på asu.edu
Tom J KazmierskiAssociate Professor, Southampton UniversityBekræftet mail på ecs.soton.ac.uk
Shidhartha DasAMDBekræftet mail på amd.com
Geoff V MerrettProfessor, University of Southampton | Head of Centre for IoT and Pervasive SystemsBekræftet mail på ecs.soton.ac.uk
Dr Basel HalakAssociate Professor,University of SouthamptonBekræftet mail på ecs.soton.ac.uk
Christos ZoniosPhD candidate, Computer Science & Engineering, University of IoanninaBekræftet mail på uoi.gr
James BantockUniversity of SouthamptonBekræftet mail på soton.ac.uk
Milosch MeriacTechnology Innovation InstitueBekræftet mail på meriac.com
Hussam AmrouchJ.-Professor, University of StuttgartBekræftet mail på iti.uni-stuttgart.de
Jörg HenkelProfessor of Computer Science, Karlsruhe Institute of TechnologyBekræftet mail på kit.edu
Sudhakar ReddyDepartment of ECE, University of IowaBekræftet mail på engineering.uiowa.edu
Steve GunnProfessor of Electronics and Computer Science, University of SouthamptonBekræftet mail på ecs.soton.ac.uk

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Vasileios Tenentes

Assistant Professor of Computer Science and Engineering, University of Ioannina

Bekræftet mail på arm.com

dependable systems energy efficient computing VLSI design and test electronic design automation


Titel Sortér efter henvisninger Sortér efter årstal Sortér efter titel	Citeret af Citeret af	År
Sensitivity and evaluation of current fire risk and future projections due to climate change: the case study of Greece A Karali, M Hatzaki, C Giannakopoulos, A Roussos, G Xanthopoulos, ... Natural Hazards and Earth System Science 14 (1), 143-153, 2014	61	2014
Aging Benefits in Nanometer CMOS Designs D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi IEEE Transactions on Circuits and Systems II: Express Briefs 64 (3), 324-328, 2017	38	2017
Reliable power gating with NBTI aging benefits D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1-10, 2016	31	2016
State skip LFSRs: Bridging the gap between test data compression and test set embedding for IP cores V Tenentes, X Kavousianos, E Kalligeros Proceedings of the conference on Design, automation and test in Europe, 474-479, 2008	28	2008
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores V Tenentes, X Kavousianos, E Kalligeros IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010	25	2010
Defect aware x-filling for low-power scan testing S Balatsouka, V Tenentes, X Kavousianos, K Chakrabarty 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010	25	2010
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure V Tenentes, D Rossi, S Yang, S Khursheed, BM Al-Hashimi, SR Gunn IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017	19	2017
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories D Rossi, V Tenentes, S Khursheed, BM Al-Hashimi IEEE international on-Line testing symposium (IOLTS'15), 2015	19	2015
NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating D Rossi, V Tenentes, S Khursheed, B Al-Hashimi 20th IEEE European Test Symposium (ETS 2015), 2015	19	2015
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets X Kavousianos, V Tenentes, K Chakrabarty, E Kalligeros IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (12 …, 2011	17	2011
High-quality statistical test compression with narrow ATE interface V Tenentes, X Kavousianos IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013	16	2013
Exploiting aging benefits for the design of reliable drowsy cache memories D Rossi, V Tenentes, SM Reddy, BM Al-Hashimi, A Brown IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2018	13	2018
BTI aware thermal management for reliable DVFS designs H Chahal, V Tenentes, D Rossi, BM Al-Hashimi 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2016	13	2016
High quality testing of grid style power gating V Tenentes, S Khursheed, BM Al-Hashimi, S Zhong, S Yang 2014 IEEE 23rd Asian Test Symposium, 186-191, 2014	10	2014
Low power test-compression for high test-quality and low test-data volume V Tenentes, X Kavousianos 20th IEEE Asian Test Symposium (ATS), 2011, 46-53, 2011	10	2011
Recycled IC detection through aging sensor D Rossi, V Tenentes, S Khursheed, SM Reddy 2018 IEEE 23rd European Test Symposium (ETS), 1-2, 2018	9	2018
Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs V Tenentes, X Kavousianos IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2011 …, 2011	9	2011
Sensitivity and evaluation of current fire risk and future projections due to climate change: the case study of Greece A Karali, M Hatzaki, C Giannakopoulos, A Roussos, G Xanthopoulos, ... Natural Hazards Earth Systems Science Discussion 1, 4777-4800, 2013	8	2013
DFT Architecture with Power-Distribution-Network Consideration for Delay-based Power Gating Test V Tenentes, S Khursheed, D Rossi, S Yang, B Al-Hashimi IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2015	7	2015
Susceptible workload driven selective fault tolerance using a probabilistic fault model MD Gutierrez, V Tenentes, TJ Kazmierski On-Line Testing and Robust System Design (IOLTS), 2016 IEEE 22nd …, 2016	6	2016

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