Naghmeh Karimi
Naghmeh Karimi
Associate Professor, Computer Science & Electrical Eng., University of Maryland Baltimore County
Verified email at - Homepage
Cited by
Cited by
The VLSI handbook
WK Chen
CRC press, 1999
Modeling, detection, and diagnosis of faults in multilevel memristor memories
S Kannan, N Karimi, R Karri, O Sinanoglu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
Online NoC switch fault detection and diagnosis using a high level fault model
A Alaghi, N Karimi, M Sedghi, Z Navabi
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007
Instruction-level impact analysis of low-level faults in a modern microprocessor controller
M Maniatakos, N Karimi, C Tirumurti, A Jas, Y Makris
IEEE Transactions on Computers, 60 (9), 1260-1273, 2011
Magic: Malicious aging in circuits/cores
N Karimi, AK Kanuparthi, X Wang, O Sinanoglu, R Karri
ACM Transactions on Architecture and Code Optimization (TACO) 12 (1), 1-25, 2015
A PUF-based modeling-attack resilient authentication protocol for IoT devices
M Ebrahimabadi, M Younis, N Karimi
IEEE Internet of Things Journal 9 (5), 3684-3703, 2021
Reconciling the IC test and security dichotomy
O Sinanoglu, N Karimi, J Rajendran, R Karri, Y Jin, K Huang, Y Makris
2013 18th IEEE European Test Symposium (ETS), 1-6, 2013
Security vulnerabilities of emerging nonvolatile main memories and countermeasures
S Kannan, N Karimi, O Sinanoglu, R Karri
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014
Detection, diagnosis, and repair of faults in memristor-based memories
S Kannan, N Karimi, R Karri, O Sinanoglu
2014 IEEE 32nd VLSI Test Symposium (VTS), 1-6, 2014
DFSSD: Deep faults and shallow state duality, a provably strong obfuscation solution for circuits with restricted access to scan chain
S Roshanisefat, HM Kamali, KZ Azar, SMP Dinakarrao, N Karimi, ...
2020 IEEE 38th VLSI Test Symposium (VTS), 1-6, 2020
Detection, diagnosis, and recovery from clock-domain crossing failures in multiclock SoCs
N Karimi, K Chakrabarty
IEEE transactions on computer-aided design of integrated circuits and …, 2013
Online network-on-chip switch fault detection and diagnosis using functional switch faults.
N Karimi, A Alaghi, M Sedghi, Z Navabi
J. Univers. Comput. Sci. 14 (22), 3716-3736, 2008
On the correlation between controller faults and instruction-level errors in modern microprocessors
N Karimi, M Maniatakos, A Jas, Y Makris
2008 IEEE International Test Conference, 1-10, 2008
Real-time prediction for IC aging based on machine learning
K Huang, X Zhang, N Karimi
IEEE Transactions on Instrumentation and Measurement 68 (12), 4756-4764, 2019
Special session: on the reliability of conventional and quantum neural network hardware
M Sadi, Y He, Y Li, M Alam, S Kundu, S Ghosh, J Bahrami, N Karimi
2022 IEEE 40th VLSI Test Symposium (VTS), 1-12, 2022
Impact of aging on the reliability of delay PUFs
N Karimi, JL Danger, S Guilley
Journal of Electronic Testing 34, 571-586, 2018
Effect of aging on PUF modeling attacks based on power side-channel observations
T Kroeger, W Cheng, S Guilley, JL Danger, N Karimi
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 454-459, 2020
Exploring the effect of device aging on static power analysis attacks
N Karimi, T Moos, A Moradi
IACR Transactions on Cryptographic Hardware and Embedded Systems, 233-256, 2019
Detecting failures and attacks via digital sensors
MTH Anik, JL Danger, S Guilley, N Karimi
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020
Lasca: Learning assisted side channel delay analysis for hardware trojan detection
A Vakil, F Behnia, A Mirzaeian, H Homayoun, N Karimi, A Sasan
2020 21st International Symposium on Quality Electronic Design (ISQED), 40-45, 2020
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