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Nathan Greeneltch
Nathan Greeneltch
Research Assistant, Northwestern University
Verified email at northwestern.edu
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Cited by
Year
High-performance SERS substrates: Advances and challenges
B Sharma, MF Cardinal, SL Kleinman, NG Greeneltch, RR Frontiera, ...
MRS bulletin 38 (8), 615-624, 2013
3582013
A look at the origin and magnitude of the chemical contribution to the enhancement mechanism of surface-enhanced Raman spectroscopy (SERS): Theory and experiment
N Valley, N Greeneltch, RP Van Duyne, GC Schatz
The Journal of Physical Chemistry Letters 4 (16), 2599-2604, 2013
3052013
Immobilized nanorod assemblies: fabrication and understanding of large area surface-enhanced Raman spectroscopy substrates
NG Greeneltch, MG Blaber, AI Henry, GC Schatz, RP Van Duyne
Analytical chemistry 85 (4), 2297-2303, 2013
1752013
Bisboronic acids for selective, physiologically relevant direct glucose sensing with surface-enhanced Raman spectroscopy
B Sharma, P Bugga, LR Madison, AI Henry, MG Blaber, NG Greeneltch, ...
Journal of the American Chemical Society 138 (42), 13952-13959, 2016
1272016
SERS of molecules that do not adsorb on Ag surfaces: a metal–organic framework-based functionalization strategy
LE Kreno, NG Greeneltch, OK Farha, JT Hupp, RP Van Duyne
Analyst 139 (16), 4073-4080, 2014
1262014
Near-infrared surface-enhanced raman spectroscopy (NIR-SERS) for the identification of eosin Y: Theoretical calculations and evaluation of two different nanoplasmonic substrates
NG Greeneltch, AS Davis, NA Valley, F Casadio, GC Schatz, ...
The Journal of Physical Chemistry A 116 (48), 11863-11869, 2012
1022012
Plasmon-Sampled Surface-Enhanced Raman Excitation Spectroscopy on Silver Immobilized Nanorod Assemblies and Optimization for Near Infrared (λex = 1064 …
NG Greeneltch, MG Blaber, GC Schatz, RP Van Duyne
The Journal of Physical Chemistry C 117 (6), 2554-2558, 2013
962013
Unraveling near-field and far-field relationships for 3D SERS substrates–a combined experimental and theoretical analysis
D Kurouski, N Large, N Chiang, N Greeneltch, KT Carron, T Seideman, ...
Analyst 141 (5), 1779-1788, 2016
512016
Microfluidic-SERS devices for one shot limit-of-detection
D Kim, AR Campos, A Datt, Z Gao, M Rycenga, ND Burrows, ...
Analyst 139 (13), 3227-3234, 2014
472014
Measurement of the Raman line widths of neat benzenethiol and a self-assembled monolayer (SAM) of benzenethiol on a silver-coated surface-enhanced Raman scattering (SERS) substrate
RL Aggarwal, LW Farrar, NG Greeneltch, RP Van Duyne, DL Polla
Applied Spectroscopy 66 (7), 740-743, 2012
142012
Aging effects of nanoscale ceria in ceria–platinum composite electrodes for direct alcohol electro-oxidation
JM Anderson, J Patel, AS Karakoti, N Greeneltch, DJ Díaz, S Seal
Electrochimica acta 56 (5), 2541-2545, 2011
132011
Measurement of the Surface-Enhanced Coherent Anti-Stokes Raman Scattering (SECARS) Due to the 1574 cm−1 Surface-Enhanced Raman Scattering (SERS …
RL Aggarwal, LW Farrar, NG Greeneltch, RP Van Duyne, DL Polla
Applied Spectroscopy 67 (2), 132-135, 2013
82013
Python Data Mining Quick Start Guide: A beginner's guide to extracting valuable insights from your data
N Greeneltch
Packt Publishing Ltd, 2019
32019
Cardinal, MF; Kleinman, SL; Greeneltch, NG; Frontiera, R. R.; Blaber, MG; Schatz, GC; Van Duyne, RP
B Sharma
Materials Research Society 38, 615-624, 2013
32013
Automotive Process Reliability Prediction for 5, 7nm using ML
S Jayaram, HJ Lee, D Kim, S Choi, S Hong, S Lee, D Kwak, S Paek, ...
2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2023
22023
Design-aware virtual metrology and process recipe recommendation
NG Greeneltch, H Yin, JA Torres, M Tao, SM Lubin, S Jayaram, I Kissiov, ...
DTCO and Computational Patterning II 12495, 445-450, 2023
22023
E.; Greeneltch, NG; Farha, OK; Hupp, JT; Van Duyne, RP
L Kreno
Analyst 139, 4073, 2014
22014
AI-guided reliability diagnosis for 5, 7nm automotive process
D Kim, HJ Lee, S Choi, S Hong, S Lee, D Kwak, S Jayaram, S Paek, ...
Metrology, Inspection, and Process Control XXXVII 12496, 932-938, 2023
12023
Reliability Prediction for Automotive 5nm and 7nm Technology node by using Machine Learning based Solution
HJ Lee, D Kim, S Choi, S Hong, D Kwak, S Jayaram, S Paek, M Kwon, ...
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023
12023
Correction to “Near-Infrared Surface-Enhanced Raman Spectroscopy (NIR-SERS) for the Identification of Eosin Y: Theoretical Calculations and Evaluation of Two Different …
NG Greeneltch, AS Davis, NA Valley, F Casadio, GC Schatz, ...
The Journal of Physical Chemistry A 118 (2), 533-533, 2014
12014
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