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Nathan Jessurun
Nathan Jessurun
Verified email at ufl.edu
Title
Cited by
Cited by
Year
Review of THz-based semiconductor assurance
J True, C Xi, N Jessurun, K Ahi, N Asadizanjani
Optical Engineering 60 (6), 060901-060901, 2021
322021
Survey of terahertz photonics and biophotonics
K Ahi, N Jessurun, MP Hosseini, N Asadizanjani
Optical Engineering 59 (6), 061629-061629, 2020
262020
Physical assurance
N Asadizanjani, MT Rahman, M Tehranipoor
Cham Switzerland: Springer Nature Switzerland AG, 2021
202021
FPIC: A novel semantic dataset for optical PCB assurance
N Jessurun, OP Dizon-Paradis, J Harrison, S Ghosh, MM Tehranipoor, ...
ACM Journal on Emerging Technologies in Computing Systems 19 (2), 1-21, 2023
162023
Shade: Automated refinement of pcb component estimates using detected shadows
NT Jessurun, OP Dizon-Paradis, M Tehranipoor, N Asadizanjani
2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-6, 2020
122020
Color normalization for robust automatic bill of materials generation and visual inspection of PCBs
OP Paradis, NT Jessurun, M Tehranipoor, N Asadizanjani
International Symposium for Testing and Failure Analysis 83348, 172-179, 2020
122020
A framework to assess the security of advanced integrated circuit (ic) packaging
C Xi, N Jessurun, N Asadizanjani
2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC), 1-7, 2020
122020
Terahertz based machine learning approach to integrated circuit assurance
J True, C Xi, N Jessurun, K Ahi, M Tehranipoor, N Asadizanjani
2021 IEEE 71st Electronic Components and Technology Conference (ECTC), 2235-2245, 2021
112021
Physical Assurance for Heterogeneous Integration: Challenges and Opportunities
C Xi, A Khan, N Jessurun, N Vashisthan, MM Tehranipoor, ...
IEEE International Symposium on the Physical and Failure Analysis of …, 2022
82022
FICS PCB X-ray: A dataset for automated printed circuit board inter-layers inspection
D Mehta, J True, OP Dizon-Paradis, N Jessurun, DL Woodard, ...
Cryptology ePrint Archive 2022, 2022
72022
A Comparison of Neural Networks for PCB Component Segmentation
A Pasunuri, N Jessurun, O Paradis, N Asadizanjani
IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 113, 2021
72021
Component detection and evaluation framework (CDEF): A semantic annotation tool
N Jessurun, O Paradis, A Roberts, N Asadizanjani
Microscopy and Microanalysis 26 (S2), 1470-1474, 2020
72020
Machine Learning Assisted Counterfeit IC Detection through Non-destructive Infrared (IR) Spectroscopy Material Characterization
C Xi, N Jessurun, J True, AA Khan, MM Tehranipoor, N Asadizanjani
Electronic Components and Technology Conference (ECTC) 72, 2022
62022
QUAINTPEAX QUantifying algorithmically INTrinsic properties of electronic assemblies via X-ray CT
J True, N Jessurun, D Mehta, N Asadi
Microscopy and Microanalysis 27 (S1), 1222-1225, 2021
52021
An overview of 3D X-ray reconstruction algorithms for PCB inspection
A Roberts, J True, NT Jessurun, DN Asadizanjani
International Symposium for Testing and Failure Analysis 83348, 188-197, 2020
52020
Semi-Supervised Semantic Annotator (S3A): Toward Efficient Semantic Labeling
N Jessurun, DE Capecci, O Dizon-Paradis, DL Woodard, N Asadizanjani
Proceedings of the Python in Science Conferences 21, 2022
22022
Digital Twin Aided IC Packaging Structure Analysis for High-quality Sample Preparation
C Xi, AA Khan, J True, N Vashistha, N Jessurun, N Asadizanjani
2021 IEEE International Symposium on the Physical and Failure Analysis of …, 2021
22021
PyQtGraph: high performance visualization for all platforms
O Moore, N Jessurun, M Chase, N Nemitz, L Campagnola
Proc. 22nd Python in Science Conference, 106-113, 2023
12023
PinPoint: An SMD Pin Localization Method
N Jessurun, J Harrison, M Tehranipoor, N Asadizanjani
International Symposium on the Physical and Failure Analysis of Integrated …, 2022
12022
Microelectronic Encapsulant Material Assessment: A Security Point of View
C Xi, J Nathan, N Asadizanjani
2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC), 157-162, 2021
12021
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