Nathan Jessurun
Nathan Jessurun
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Review of THz-based semiconductor assurance
J True, C Xi, N Jessurun, K Ahi, N Asadizanjani
Optical Engineering 60 (6), 060901-060901, 2021
Survey of terahertz photonics and biophotonics
K Ahi, N Jessurun, MP Hosseini, N Asadizanjani
Optical Engineering 59 (6), 061629-061629, 2020
Physical assurance
N Asadizanjani, MT Rahman, M Tehranipoor
Cham Switzerland: Springer Nature Switzerland AG, 2021
FPIC: a novel semantic dataset for optical PCB assurance
N Jessurun, OP Dizon-Paradis, J Harrison, S Ghosh, MM Tehranipoor, ...
ACM Journal on Emerging Technologies in Computing Systems 19 (2), 1-21, 2023
Color normalization for robust automatic bill of materials generation and visual inspection of pcbs
OP Paradis, NT Jessurun, M Tehranipoor, N Asadizanjani
ISTFA 2020, 172-179, 2020
Shade: Automated refinement of pcb component estimates using detected shadows
NT Jessurun, OP Dizon-Paradis, M Tehranipoor, N Asadizanjani
2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-6, 2020
A framework to assess the security of advanced integrated circuit (ic) packaging
C Xi, N Jessurun, N Asadizanjani
2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC), 1-7, 2020
Terahertz based machine learning approach to integrated circuit assurance
J True, C Xi, N Jessurun, K Ahi, M Tehranipoor, N Asadizanjani
2021 IEEE 71st Electronic Components and Technology Conference (ECTC), 2235-2245, 2021
FICS PCB X-ray: A dataset for automated printed circuit board inter-layers inspection
D Mehta, J True, OP Dizon-Paradis, N Jessurun, DL Woodard, ...
Cryptology ePrint Archive 2022, 2022
A Comparison of Neural Networks for PCB Component Segmentation
A Pasunuri, N Jessurun, O Paradis, N Asadizanjani
IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 113, 2021
Component detection and evaluation framework (CDEF): A semantic annotation tool
N Jessurun, O Paradis, A Roberts, N Asadizanjani
Microscopy and Microanalysis 26 (S2), 1470-1474, 2020
Machine Learning Assisted Counterfeit IC Detection through Non-destructive Infrared (IR) Spectroscopy Material Characterization
C Xi, N Jessurun, J True, AA Khan, MM Tehranipoor, N Asadizanjani
Electronic Components and Technology Conference (ECTC) 72, 2022
Physical Assurance for Heterogeneous Integration: Challenges and Opportunities
C Xi, A Khan, N Jessurun, N Vashisthan, MM Tehranipoor, ...
IEEE International Symposium on the Physical and Failure Analysis of …, 2022
QUAINTPEAX QUantifying algorithmically INTrinsic properties of electronic assemblies via X-ray CT
J True, N Jessurun, D Mehta, N Asadi
Microscopy and Microanalysis 27 (S1), 1222-1225, 2021
An Overview of 3D X-Ray Reconstruction Algorithms for PCB Inspection
A Roberts, J True, NT Jessurun, DN Asadizanjani
ISTFA 2020, 188-197, 2020
Semi-Supervised Semantic Annotator (S3A): Toward Efficient Semantic Labeling
N Jessurun, DE Capecci, O Dizon-Paradis, DL Woodard, N Asadizanjani
Proceedings of the Python in Science Conferences 21, 2022
PyQtGraph: high performance visualization for all platforms
O Moore, N Jessurun, M Chase, N Nemitz, L Campagnola
Proc. 22nd Python in Science Conference (eds Agarwal, M., Calloway, C. & and …, 2023
PinPoint: An SMD Pin Localization Method
N Jessurun, J Harrison, M Tehranipoor, N Asadizanjani
International Symposium on the Physical and Failure Analysis of Integrated …, 2022
Geometry Aware X-ray Imaging and Reconstruction for PCB Assurance
J True, N Jessurun, M Tehranipoor, N Asadizanjani
Government Microcircuit Applications and Critical Technology Conference …, 2021
Digital Twin Aided IC Packaging Structure Analysis for High-quality Sample Preparation
C Xi, AA Khan, J True, N Vashistha, N Jessurun, N Asadizanjani
2021 IEEE International Symposium on the Physical and Failure Analysis of …, 2021
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