BRUNO NERI
BRUNO NERI
Verified email at iet.unipi.it
Title
Cited by
Cited by
Year
Electromigration in thin-film interconnection lines: models, methods and results
A Scorzoni, B Neri, C Caprile, F Fantini
Materials Science Reports 7 (4-5), 143-220, 1991
1721991
Low‐frequency noise in silicon‐gate metal‐oxide‐silicon capacitors before oxide breakdown
B Neri, P Olivo, B Ricco
Applied physics letters 51 (25), 2167-2169, 1987
1001987
Electromigration and low-frequency resistance fluctuations in aluminum thin-film interconnections
B Neri, A Diligenti, PE Bagnoli
IEEE transactions on electron devices 34 (11), 2317-2322, 1987
951987
How breath-control can change your life: a systematic review on psycho-physiological correlates of slow breathing
A Zaccaro, A Piarulli, M Laurino, E Garbella, D Menicucci, B Neri, ...
Frontiers in human neuroscience 12, 353, 2018
942018
Low-frequency noise measurements as a characterization tool for degradation phenomena in solid-state devices
C Ciofi, B Neri
Journal of Physics D: Applied Physics 33 (21), R199, 2000
932000
Ultra low-noise preamplifier for low-frequency noise measurements in electron devices
B Neri, B Pellegrini, R Saletti
IEEE transactions on instrumentation and measurement 40 (1), 2-6, 1991
671991
Electrical and thermal transient during dielectric breakdown of thin oxides in metal--silicon capacitors
S Lombardo, F Crupi, A La Magna, C Spinella, A Terrasi, A La Mantia, ...
Journal of applied physics 84 (1), 472-479, 1998
631998
Gas and vapour effects on the resistance fluctuation spectra of conducting polymer thin-film resistors
P Bruschi, F Cacialli, A Nannini, B Neri
Sensors and Actuators B: Chemical 19 (1-3), 421-425, 1994
521994
Noise and fluctuations in submicrometric Al-Si interconnect lines
B Neri, C Ciofi, V Dattilo
IEEE Transactions On Electron Devices 44 (9), 1454-1459, 1997
481997
Radar sensor signal acquisition and multidimensional FFT processing for surveillance applications in transport systems
S Saponara, B Neri
IEEE Transactions on Instrumentation and Measurement 66 (4), 604-615, 2017
422017
A study of electromigration in aluminum and aluminum-silicon thin film resistors using noise technique
A Diligenti, PE Bagnoli, B Neri, S Bea, L Mantellassi
Solid-state electronics 32 (1), 11-16, 1989
371989
Wearable system-on-a-chip UWB radar for health care and its application to the safety improvement of emergency operators
D Zito, D Pepe, B Neri, D De Rossi, A Lanata, A Tognetti, EP Scilingo
2007 29th Annual International Conference of the IEEE Engineering in …, 2007
362007
Ultra low-noise current sources
C Ciofi, R Giannetti, V Dattilo, B Neri
IEEE Transactions on Instrumentation and Measurement 47 (1), 78-81, 1998
361998
Feasibility study and design of a wearable system-on-a-chip pulse radar for contactless cardiopulmonary monitoring
D Zito, D Pepe, B Neri, F Zito, D De Rossi, A Lanatà
International journal of telemedicine and applications 2008, 2008
352008
Magnetic field stabilization for magnetically shielded volumes by external field coils
T Bryś, S Czekaj, M Daum, P Fierlinger, D George, R Henneck, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2005
352005
Electromigration detection by means of low-frequency noise measurements in thin-film interconnections
A Diligenti, B Neri, PE Bagnoli, A Barsanti, M Rizzo
IEEE electron device letters 6 (11), 606-608, 1985
351985
Vapour and gas sensing by noise measurements on polymeric balanced bridge microstructures
P Bruschi, A Nannini, B Neri
Sensors and Actuators B: Chemical 25 (1-3), 429-432, 1995
341995
Theory and experiment of suppressed shot noise in'stress-induced leakage currents
G Iannaccone, F Crupi, B Neri, S Lombardo
IEEE Transactions on Electron Devices 50 (5), 1363-1369, 2003
332003
Dedicated instrumentation for high sensitivity, low frequency noise measurement systems
C Ciofi, G Giusi, G Scandurra, B Neri
Fluctuation and Noise Letters 4 (02), L385-L402, 2004
322004
Criteria for the evaluation of unconditional stability of microwave linear two-ports: a critical review and new proof
G Lombardi, B Neri
IEEE Transactions on Microwave Theory and Techniques 47 (6), 746-751, 1999
321999
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