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M Tanjidur Rahman
M Tanjidur Rahman
Florida Institute for Cyber-security Research, ECE, University of Florida
Verified email at ufl.edu - Homepage
Title
Cited by
Cited by
Year
The key is left under the mat: On the inappropriate security assumption of logic locking schemes
MT Rahman, S Tajik, MS Rahman, M Tehranipoor, N Asadizanjani
2020 IEEE International Symposium on Hardware Oriented Security and Trust …, 2020
962020
Hardware trust and assurance through reverse engineering: A tutorial and outlook from image analysis and machine learning perspectives
UJ Botero, R Wilson, H Lu, MT Rahman, MA Mallaiyan, F Ganji, ...
ACM Journal on Emerging Technologies in Computing Systems (JETC) 17 (4), 1-53, 2021
882021
Defense-in-depth: A recipe for logic locking to prevail
MT Rahman, MS Rahman, H Wang, S Tajik, W Khalil, F Farahmandi, ...
Integration 72, 39-57, 2020
862020
The big hack explained: Detection and prevention of PCB supply chain implants
D Mehta, H Lu, OP Paradis, MA MS, MT Rahman, Y Iskander, P Chawla, ...
ACM Journal on Emerging Technologies in Computing Systems (JETC) 16 (4), 1-25, 2020
762020
Trojan Scanner: Detecting Hardware Trojans with Rapid SEM Imaging Combined with Image Processing and Machine Learning
NAMT Nidish Vashistha, Hangwei Lu, Qihang Shi, M Tanjidur Rahman, Haoting ...
International symposium for Testing and Failure Analysis, 256, 2018
75*2018
Physical inspection & attacks: New frontier in hardware security
MT Rahman, Q Shi, S Tajik, H Shen, DL Woodard, M Tehranipoor, ...
2018 IEEE 3rd International Verification and Security Workshop (IVSW), 93-102, 2018
642018
Detecting Hardware Trojans Inserted by Untrusted Foundry Using Physical Inspection and Advanced Image Processing
MT Nidish Vashistha, Tanjidur Rahman, Haoting Shen, Damon L. Woodard, Navid ...
Journal of Hardware and Systems Security 2 (4), 2018
462018
Is backside the new backdoor in modern socs?
N Vashistha, MT Rahman, OP Dizon-Paradis, N Asadizanjani
2019 IEEE International Test Conference (ITC), 1-10, 2019
222019
Backside security assessment of modern SoCs
MT Rahman, N Asadizanjani
2019 20th International Workshop on Microprocessor/SoC Test, Security and …, 2019
182019
Atpg-guided fault injection attacks on logic locking
A Jain, MT Rahman, U Guin
2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-6, 2020
172020
Physical Assurance
N Asadizanjani, MT Rahman, M Tehranipoor
Cham Switzerland: Springer Nature Switzerland AG, 2021
162021
Special session: Novel attacks on logic-locking
A Jain, U Guin, MT Rahman, N Asadizanjani, D Duvalsaint, RDS Blanton
2020 IEEE 38th VLSI Test Symposium (VTS), 1-10, 2020
162020
Secure interposer-based heterogeneous integration
MSM Khan, C Xi, AA Khan, MT Rahman, MM Tehranipoor, ...
IEEE Design & Test 39 (6), 156-164, 2022
132022
Concealing-gate: Optical contactless probing resilient design
MT Rahman, NF Dipu, D Mehta, S Tajik, M Tehranipoor, N Asadizanjani
ACM Journal on Emerging Technologies in Computing Systems (JETC) 17 (3), 1-25, 2021
112021
A time-dependent collisional sheath model for dual-frequency capacitively coupled RF plasma
MT Rahman, MNA Dewan, A Ahmed, MRH Chowdhury
IEEE Transactions on Plasma Science 41 (1), 17-23, 2012
112012
On Backside Probing Techniques and Their Emerging Security Threats
LK Biswas, L Lavdas, MT Rahman, M Tehranipoor, N Asadizanjani
IEEE Design & Test 39 (6), 172-179, 2022
92022
On optical attacks making logic obfuscation fragile
L Lavdas, MT Rahman, M Tehranipoor, N Asadizanjani
2020 IEEE International Test Conference in Asia (ITC-Asia), 71-76, 2020
92020
Analytical determination of collisional sheath properties for triple frequency capacitively coupled plasma
MT Rahman, MNA Dewan
IEEE Transactions on Plasma Science 42 (3), 729-734, 2014
82014
Hardware trust and assurance through reverse engineering
UJ Botero, R Wilson, H Lu, MT Rahman, MA Mallaiyan, F Ganji, ...
Association for Computing Machinery: New York, NY, USA, 2020
72020
Counterfeit detection and avoidance with physical inspection
N Asadizanjani, MT Rahman, M Tehranipoor, N Asadizanjani, ...
Physical Assurance: For Electronic Devices and Systems, 21-47, 2021
62021
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Articles 1–20