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Haoyang Ni
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Data-driven electron-diffraction approach reveals local short-range ordering in CrCoNi with ordering effects
HW Hsiao, R Feng, H Ni, K An, JD Poplawsky, PK Liaw, JM Zuo
Nature communications 13 (1), 6651, 2022
412022
Quantifying atomically dispersed catalysts using deep learning assisted microscopy
H Ni, Z Wu, X Wu, JG Smith, MJ Zachman, J Zuo, L Ju, G Zhang, M Chi
Nano letters 23 (16), 7442-7448, 2023
52023
Fluctuation Component Analysis-based K-Means Clustering in 4D-STEM of Heterogeneous Materials
H Hou, S Pidaparthy, H Ni, JM Zuo
Microscopy and Microanalysis 29 (Supplement_1), 687-688, 2023
12023
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials
S Pidaparthy, H Ni, H Hou, DP Abraham, JM Zuo
Ultramicroscopy 248, 113718, 2023
12023
Selective Catalytic Behavior Induced by Crystal‐Phase Transformation in Well‐Defined Bimetallic Pt‐Sn Nanocrystals
B Werghi, L Wu, AM Ebrahim, M Chi, H Ni, M Cargnello, SR Bare
Small 19 (20), 2207956, 2023
12023
Fluctuation Cepstral STEM for Imaging Disordered Materials
S Pidaparthy, H Ni, H Hou, DP Abraham, JM Zuo
Microscopy and Microanalysis 28 (S1), 450-452, 2022
12022
Chemical Short-Range Ordering in a CrCoNi Medium-Entropy Alloy
HW Hsiao, R Feng, H Ni, K An, JD Poplawsky, PK Liaw, JM Zuo
arXiv preprint arXiv:2206.02004, 2022
12022
4D-STEM Mapping of Nanocrystal Reaction Dynamics and Heterogeneity in a Graphene Liquid Cell
C Liu, O Lin, S Pidaparthy, H Ni, Z Lyu, JM Zuo, Q Chen
Nano Letters, 2024
2024
Real-space Visualization of Charge Density Wave Induced Local Inversion-Symmetry Breaking in a Skyrmion Magnet
H Ni, WR Meier, H Miao, AJ May, BC Sales, J Zuo, M Chi
arXiv preprint arXiv:2311.17682, 2023
2023
Electron Microscopy of Electrochemical Degradation in Energy Materials across Multiple Length Scales: Challenges and Opportunities
JM Zuo, R Busch, S Pidaparthy, H Ni, H Hou, DP Abraham
Microscopy and Microanalysis 29 (Supplement_1), 1272-1273, 2023
2023
Imaging Modulated Structure in EuAl4 using Cryogenic 4D-STEM
H Ni, J Zuo, M Chi
Microscopy and Microanalysis 29 (Supplement_1), 1713-1713, 2023
2023
Extending 4D-STEM to Defect and Short-range Ordering Analysis: Principles, Methodology and Applications
JM Zuo, HW Hsiao, K Yin, HC Ni, H Ni, R Busch, R Yuan, J Zhang
Microscopy and Microanalysis 29 (Supplement_1), 249-250, 2023
2023
Optimizing STEM Imaging Conditions Towards Reliable Representation of Single Atom Catalysts
H Ni, J Zuo, M Chi
Microscopy and Microanalysis 28 (S1), 2130-2132, 2022
2022
Compressed Sensing Inspired Line Feature Detection for In-Situ Transmission Electron Microscopy
H Ni, A Yoon, JM Zuo
Microscopy and Microanalysis 27 (S1), 2218-2219, 2021
2021
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