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Co-authors
Muneesh MaheshwariNational Institute of Standards and Technology, Gaithersburg, USAVerified email at nist.gov- Yang YaowenNanyang Technological UniversityVerified email at NTU.EDU.SG
- Kai LiSenior Research Scientist and CMU-Portugal Research Fellow, CISTER research centre, PortugalVerified email at ieee.org
- Chau YuenIEEE Fellow, Highly Cited Researcher, Nanyang Technological UniversityVerified email at ntu.edu.sg
- Deepesh UpadrashtaScientist, Advanced Remanufacturing and Technology Centre, A*STARVerified email at artc.a-star.edu.sg
- Abhishek SharmaAssociate Professor, The LNMIITVerified email at lnmiit.ac.in
- Hasala MarakkalageSingapore University of Technology and DesignVerified email at alumni.sutd.edu.sg
- Billy LauResearch Scientist, Georgia Institute of TechnologyVerified email at cc.gatech.edu
- Ng Kai Kiat BennyVerified email at sutd.edu.sg
- Linglong DaiProfessor, Tsinghua University; IEEE FellowVerified email at tsinghua.edu.cn
- meng zhangShanghai Jiaotong UniversityVerified email at sjtu.edu.cn
- Sandeep SainiAssistant Professor, ECE, The LNM Institute of Information Technology, JaipurVerified email at lnmiit.ac.in
- Thinagaran PerumalAssociate Professor,Universiti Putra MalaysiaVerified email at upm.edu.my
- Kritika JohariSingapore University of Technology and DesignVerified email at mymail.sutd.edu.sg
