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Ibrahim Guven
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The finite element method and applications in engineering using ANSYS®
E Madenci, I Guven
Springer, 2015
12362015
Predicting crack propagation with peridynamics: a comparative study
A Agwai, I Guven, E Madenci
International journal of fracture 171, 65-78, 2011
2592011
Finite element modeling of BGA packages for life prediction
G Gustafsson, I Guven, V Kradinov, E Madenci
2000 Proceedings. 50th Electronic Components and Technology Conference (Cat …, 2000
862000
Fatigue failure model with peridynamic theory
E Oterkus, I Guven, E Madenci
2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2010
782010
Impact damage assessment by using peridynamic theory
E Oterkus, I Guven, E Madenci
Central European journal of engineering 2, 523-531, 2012
632012
Analysis of singular stress fields at junctions of multiple dissimilar materials under mechanical and thermal loading
A Barut, I Guven, E Madenci
International Journal of Solids and Structures 38 (50-51), 9077-9109, 2001
612001
Fatigue Life Prediction of Solder Joints in Electronic Packages with Ansys®
E Madenci, I Guven, B Kilic
Springer Science & Business Media, 2002
452002
Experimental and numerical characterization of non-Fickian moisture diffusion in electronic packages
E Celik, I Guven, E Madenci
IEEE transactions on advanced packaging 32 (3), 666-674, 2009
342009
The necessity of reexamining previous life prediction analyses of solder joints in electronic packages
T Anderson, I Guven, E Madenci, G Gustafsson
1999 Proceedings. 49th Electronic Components and Technology Conference (Cat …, 1999
321999
Predicting crack initiation and propagation using XFEM, CZM and peridynamics: A comparative study
A Agwai, I Guven, E Madenci
2010 Proceedings 60th electronic components and technology conference (ECTC …, 2010
312010
Hydraulic properties of porous sintered glass bead systems
I Gueven, S Frijters, J Harting, S Luding, H Steeb
Granular matter 19 (2), 28, 2017
292017
Solder joint fatigue life prediction using peridynamic approach
F Baber, I Guven
Microelectronics Reliability 79, 20-31, 2017
272017
Crack propagation in multilayer thin-film structures of electronic packages using the peridynamic theory
A Agwai, I Guven, E Madenci
Microelectronics Reliability 51 (12), 2298-2305, 2011
272011
Mechanical characterization of nickel nanowires by using a customized atomic force microscope
E Celik, I Guven, E Madenci
Nanotechnology 22 (15), 155702, 2011
272011
Transient two-dimensional thermal analysis of electronic packages by the boundary element method
I Guven, CL Chan, E Madenci
IEEE transactions on advanced packaging 22 (3), 476-486, 1999
271999
Damage prediction for electronic package drop test using finite element method and peridynamic theory
A Agwai, I Guven, E Madenci
2009 59th Electronic Components and Technology Conference, 565-569, 2009
262009
Drop-shock failure prediction in electronic packages by using peridynamic theory
A Agwai, I Guven, E Madenci
IEEE Transactions on Components, Packaging and Manufacturing Technology 2 (3 …, 2012
202012
Simulations of nanowire bend tests for extracting mechanical properties
E Celik, I Guven, E Madenci
Theoretical and Applied Fracture Mechanics 55 (3), 185-191, 2011
202011
Peridynamic theory for impact damage prediction and propagation in electronic packages due to drop
A Agwai, I Guven, E Madenci
2008 58th Electronic Components and Technology Conference, 1048-1053, 2008
202008
Revisit of life-prediction model for solder joints
T Anderson, A Barut, I Guven, E Madenci
2000 Proceedings. 50th Electronic Components and Technology Conference (Cat …, 2000
182000
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