| Resolution limits in practical digital holographic systems DP Kelly, BM Hennelly, N Pandey, TJ Naughton, WT Rhodes Optical Engineering 48 (9), 095801-095801-13, 2009 | 141 | 2009 |
| Extended viewing angle holographic display system with tilted SLMs in a circular configuration T Kozacki, M Kujawińska, G Finke, B Hennelly, N Pandey Applied optics 51 (11), 1771-1780, 2012 | 105 | 2012 |
| Quantization noise and its reduction in lensless Fourier digital holography N Pandey, B Hennelly Applied Optics 50 (7), B58-B70, 2011 | 61 | 2011 |
| Digital holographic capture and optoelectronic reconstruction for 3D displays DP Kelly, DS Monaghan, N Pandey, T Kozacki, A Michałkiewicz, G Finke, ... International journal of digital multimedia broadcasting 2010, 2010 | 54 | 2010 |
| Twin removal in digital holography using diffuse illumination DS Monaghan, DP Kelly, N Pandey, BM Hennelly Optics letters 34 (23), 3610-3612, 2009 | 46 | 2009 |
| Optical properties of photopolymerizable nanocomposites containing nanosized molecular sieves I Naydenova, E Leite, T Babeva, N Pandey, T Baron, T Yovcheva, ... Journal of Optics 13 (4), 044019, 2011 | 30 | 2011 |
| Investigation of the light induced redistribution of zeolite Beta nanoparticles in an acrylamide-based photopolymer E Leite, I Naydenova, N Pandey, T Babeva, G Majano, S Mintova, V Toal Journal of Optics A: Pure and Applied Optics 11 (2), 024016, 2009 | 28 | 2009 |
| Inspection apparatus, inspection method and manufacturing method AJ Den Boef, SGJ Mathijssen, N Pandey, SM Witte, K Eikema US Patent 9,632,039, 2017 | 26 | 2017 |
| Review of twin reduction and twin removal techniques in holography BM Hennelly, DP Kelly, N Pandey, DS Monaghan National University of Ireland Maynooth, 2009 | 25 | 2009 |
| Effect of additive noise on phase measurement in digital holographic microscopy N Pandey, B Hennelly 3D Research 2 (1), 1-6, 2011 | 24 | 2011 |
| Diffraction-based overlay metrology using angular-multiplexed acquisition of dark-field digital holograms C Messinis, TTM van Schaijk, N Pandey, VT Tenner, S Witte, JF de Boer, ... Optics Express 28 (25), 37419-37435, 2020 | 19 | 2020 |
| Technique for characterization of dimensional changes in slanted holographic gratings by monitoring the angular selectivity profile N Pandey, I Naydenova, S Martin, V Toal Optics letters 33 (17), 1981-1983, 2008 | 17 | 2008 |
| Holographic recording in acrylamide photopolymers: thickness limitations MS Mahmud, I Naydenova, N Pandey, T Babeva, R Jallapuram, S Martin, ... Applied Optics 48 (14), 2642-2648, 2009 | 15 | 2009 |
| Aberration calibration and correction with nano-scatterers in digital holographic microscopy for semiconductor metrology C Messinis, TTM van Schaijk, N Pandey, A Koolen, I Shlesinger, X Liu, ... Optics Express 29 (23), 38237-38256, 2021 | 14 | 2021 |
| Metrology method and apparatus, computer program and lithographic system N Pandey, Z Zili, AEA Koolen, G Van Der Zouw US Patent 10,191,391, 2019 | 13 | 2019 |
| Fixed-point numercial-reconstruction for digital holographic microscopy N Pandey, B Hennelly Optics letters 35 (7), 1076-1078, 2010 | 13 | 2010 |
| Speed up of Fresnel transforms for digital holography using pre-computed chirp and GPU processing N Pandey, DP Kelly, TJ Naughton, BM Hennelly Optics and Photonics for Information Processing III 7442, 31-41, 2009 | 13 | 2009 |
| Zoom algorithms for digital holography BM Hennelly, DP Kelly, DS Monaghan, N Pandey Information Optics and Photonics: Algorithms, Systems, and Applications, 187-204, 2010 | 12 | 2010 |
| Metrology system and method for determining a characteristic of one or more structures on a substrate PAJ Tinnemans, AJ Den Boef, AEA Koolen, N Pandey, VT Tenner, ... US Patent 10,816,909, 2020 | 11 | 2020 |
| Method of measuring a structure, inspection apparatus, lithographic system, device manufacturing method and wavelength-selective filter for use therein N Pandey, AJ Den Boef, MJM Van Dam US Patent 10,365,565, 2019 | 9 | 2019 |
