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Co-authors
David DoermannProfessor, University at BuffaloVerified email at buffalo.edu
Baochang zhangBeihang universityVerified email at buaa.edu.cn
Ziyan WuUII America, Inc.Verified email at rpi.edu
Terrence ChenUII America, Inc.Verified email at uii-ai.com
Junsong YuanState University of New York at BuffaloVerified email at buffalo.edu
Benjamin PlancheUII America, Inc.Verified email at uii-ai.com
Meng ZhengUII America, Inc.Verified email at uii-ai.com
Arun Innanjesoftware engineering, Software Architecture, UI UX, deep learningVerified email at uii-ai.com
Srikrishna KaranamAdobe Research IndiaVerified email at ieee.org
Liangchen SongAppleVerified email at apple.com
Abhishek SharmaUnited Imaging IntelligenceVerified email at northeastern.edu
Wentao ZhuUCI; CASVerified email at uci.edu
Sheng Xu 徐昇Beihang UniversityVerified email at buaa.edu.cn
Teli MaHKUST(GZ) | Shanghai AI LaboratoryVerified email at pjlab.org.cn
Yi XuOPPO US Research CenterVerified email at oppo.com
Tianyu LuanUniversity at BuffaloVerified email at buffalo.edu
Lichang ChenUniversity of Maryland; Google DeepmindVerified email at cs.umd.edu
Lele ChenResearch Scientist @ Sony AIVerified email at sony.com
Zhang ChenInnopeak Technology (OPPO US Research Center)Verified email at shanghaitech.edu.cn
Yefeng ZhengTencent, Shenzhen, China, IEEE Fellow, AIMBE FellowVerified email at tencent.com