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Fahim Rahman
Fahim Rahman
Research Assistant Professor
Verified email at ece.ufl.edu
Title
Cited by
Cited by
Year
An aging-resistant RO-PUF for reliable key generation
MT Rahman, F Rahman, D Forte, M Tehranipoor
IEEE Transactions on Emerging Topics in Computing 4 (3), 335-348, 2015
1502015
Introduction to cyber-physical system security: A cross-layer perspective
J Wurm, Y Jin, Y Liu, S Hu, K Heffner, F Rahman, M Tehranipoor
IEEE Transactions on Multi-Scale Computing Systems 3 (3), 215-227, 2016
1032016
Electronics supply chain integrity enabled by blockchain
X Xu, F Rahman, B Shakya, A Vassilev, D Forte, M Tehranipoor
ACM Transactions on Design Automation of Electronic Systems (TODAES) 24 (3 …, 2019
852019
Sofi: Security property-driven vulnerability assessments of ics against fault-injection attacks
H Wang, H Li, F Rahman, MM Tehranipoor, F Farahmandi
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2021
372021
Soc security verification using property checking
N Farzana, F Rahman, M Tehranipoor, F Farahmandi
2019 IEEE International Test Conference (ITC), 1-10, 2019
372019
A pair selection algorithm for robust RO-PUF against environmental variations and aging
MT Rahman, D Forte, F Rahman, M Tehranipoor
2015 33rd IEEE International Conference on Computer Design (ICCD), 415-418, 2015
332015
Security assessment of dynamically obfuscated scan chain against oracle-guided attacks
MS Rahman, A Nahiyan, F Rahman, S Fazzari, K Plaks, F Farahmandi, ...
ACM Transactions on Design Automation of Electronic Systems (TODAES) 26 (4 …, 2021
322021
Leveraging side-channel information for disassembly and security
J Park, F Rahman, A Vassilev, D Forte, M Tehranipoor
ACM Journal on Emerging Technologies in Computing Systems (JETC) 16 (1), 1-21, 2019
312019
FPGA bitstream security: a day in the life
A Duncan, F Rahman, A Lukefahr, F Farahmandi, M Tehranipoor
2019 IEEE International Test Conference (ITC), 1-10, 2019
292019
eChain: a blockchain-enabled ecosystem for electronic device authenticity verification
N Vashistha, MM Hossain, MR Shahriar, F Farahmandi, F Rahman, ...
IEEE Transactions on Consumer Electronics 68 (1), 23-37, 2021
272021
Security beyond CMOS: fundamentals, applications, and roadmap
F Rahman, B Shakya, X Xu, D Forte, M Tehranipoor
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (12 …, 2017
272017
PQC-SEP: Power Side-channel Evaluation Platform for Post-Quantum Cryptography Algorithms.
J Park, NN Anandakumar, D Saha, D Mehta, N Pundir, F Rahman, ...
IACR Cryptol. ePrint Arch. 2022, 527, 2022
212022
EMFORCED: EM-based fingerprinting framework for remarked and cloned counterfeit IC detection using machine learning classification
A Stern, U Botero, F Rahman, D Forte, M Tehranipoor
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (2), 363-375, 2019
212019
Hardware-assisted cybersecurity for IoT devices
F Rahman, M Farmani, M Tehranipoor, Y Jin
2017 18th International Workshop on Microprocessor and SOC Test and …, 2017
202017
Reliability vs. security: Challenges and opportunities for developing reliable and secure integrated circuits
F Rahman, D Forte, MM Tehranipoor
2016 IEEE International Reliability Physics Symposium (IRPS), 4C-6-1-4C-6-10, 2016
202016
Dynamically obfuscated scan chain to resist oracle-guided attacks on logic locked design
MS Rahman, A Nahiyan, S Amir, F Rahman, F Farahmandi, D Forte, ...
Cryptology ePrint Archive, 2019
182019
O'clock: lock the clock via clock-gating for soc ip protection
MS Rahman, R Guo, HM Kamali, F Rahman, F Farahmandi, ...
Proceedings of the 59th ACM/IEEE Design Automation Conference, 775-780, 2022
172022
Interconnect-based PUF with signature uniqueness enhancement
L Yu, X Wang, F Rahman, M Tehranipoor
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (2), 339-352, 2019
172019
Rethinking watermark: Providing proof of ip ownership in modern socs
NN Anandakumar, MS Rahman, MMM Rahman, R Kibria, U Das, ...
Cryptology ePrint Archive, 2022
162022
Fpga-chain: Enabling holistic protection of fpga supply chain with blockchain technology
T Zhang, F Rahman, M Tehranipoor, F Farahmandi
IEEE Design & Test 40 (2), 127-136, 2022
152022
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