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Hamid Mahmoodi
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Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits
K Roy, S Mukhopadhyay, H Mahmoodi-Meimand
Proceedings of the IEEE 91 (2), 305-327, 2003
32182003
Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS
S Mukhopadhyay, H Mahmoodi, K Roy
IEEE transactions on computer-aided design of integrated circuits and …, 2005
6102005
A process-tolerant cache architecture for improved yield in nanoscale technologies
A Agarwal, BC Paul, H Mahmoodi, A Datta, K Roy
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13 (1), 27-38, 2005
2682005
Ultra low-power clocking scheme using energy recovery and clock gating
H Mahmoodi, V Tirumalashetty, M Cooke, K Roy
IEEE transactions on very large scale integration (VLSI) systems 17 (1), 33-44, 2008
2392008
Diode-footed domino: A leakage-tolerant high fan-in dynamic circuit design style
H Mahmoodi-Meimand, K Roy
IEEE Transactions on Circuits and Systems I: Regular Papers 51 (3), 495-503, 2004
2112004
Estimation of delay variations due to random-dopant fluctuations in nanoscale CMOS circuits
H Mahmoodi, S Mukhopadhyay, K Roy
IEEE Journal of Solid-State Circuits 40 (9), 1787-1796, 2005
2022005
Statistical design and optimization of SRAM cell for yield enhancement
S Mukhopadhyay, H Mahmoodi, K Roy
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004 …, 2004
1712004
Low-power scan design using first-level supply gating
S Bhunia, H Mahmoodi, D Ghosh, S Mukhopadhyay, K Roy
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13 (3), 384-395, 2005
1702005
Computation sharing programmable FIR filter for low-power and high-performance applications
J Park, W Jeong, H Mahmoodi-Meimand, Y Wang, H Choo, K Roy
IEEE Journal of solid-state Circuits 39 (2), 348-357, 2004
1552004
Modeling and circuit synthesis for independently controlled double gate FinFET devices
A Datta, A Goel, RT Cakici, H Mahmoodi, D Lekshmanan, K Roy
IEEE Transactions on Computer-aided Design of Integrated circuits and …, 2007
1182007
Modeling and estimation of failure probability due to parameter variations in nano-scale SRAMs for yield enhancement
S Mukhopadhyay, H Mahmoodi-Meimand, K Roy
2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No …, 2004
1162004
A low-power SRAM using bit-line charge-recycling
K Kim, H Mahmoodi, K Roy
IEEE journal of solid-state circuits 43 (2), 446-459, 2008
1082008
Design of a process variation tolerant self-repairing SRAM for yield enhancement in nanoscaled CMOS
S Mukhopadhyay, K Kim, H Mahmoodi, K Roy
IEEE Journal of Solid-State Circuits 42 (6), 1370-1382, 2007
942007
Double-gate SOI devices for low-power and high-performance applications
K Roy, H Mahmoodi, S Mukhopadhyay, H Ananthan, A Bansal, T Cakici
ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005 …, 2005
932005
Asymmetrically doped FinFETs for low-power robust SRAMs
F Moradi, SK Gupta, G Panagopoulos, DT Wisland, H Mahmoodi, K Roy
IEEE transactions on electron devices 58 (12), 4241-4249, 2011
872011
Domino logic designs for high-performance and leakage-tolerant applications
F Moradi, TV Cao, EI Vatajelu, A Peiravi, H Mahmoodi, DT Wisland
Integration 46 (3), 247-254, 2013
812013
Data-retention flip-flops for power-down applications
H Mahmoodi-Meimand, K Roy
2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No …, 2004
742004
Modeling and testing of SRAM for new failure mechanisms due to process variations in nanoscale CMOS
Q Chen, H Mahmoodi, S Bhunia, K Roy
23rd IEEE VLSI Test Symposium (VTS'05), 292-297, 2005
712005
Security and complexity analysis of LUT-based obfuscation: From blueprint to reality
G Kolhe, HM Kamali, M Naicker, TD Sheaves, H Mahmoodi, PDS Manoj, ...
2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2019
672019
Hybrid STT-CMOS designs for reverse-engineering prevention
T Winograd, H Salmani, H Mahmoodi, K Gaj, H Homayoun
Proceedings of the 53rd Annual Design Automation Conference, 1-6, 2016
672016
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