| Verification-guided soft error resilience SA Seshia, W Li, S Mitra 2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007 | 146 | 2007 |
| Scalable specification mining for verification and diagnosis W Li, A Forin, SA Seshia Proceedings of the 47th design automation conference, 755-760, 2010 | 138 | 2010 |
| Reverse engineering digital circuits using structural and functional analyses P Subramanyan, N Tsiskaridze, W Li, A Gascón, WY Tan, A Tiwari, ... IEEE Transactions on Emerging Topics in Computing 2 (1), 63-80, 2013 | 134 | 2013 |
| Design automation of cyber-physical systems: Challenges, advances, and opportunities SA Seshia, S Hu, W Li, Q Zhu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016 | 132 | 2016 |
| Synthesis for human-in-the-loop control systems W Li, D Sadigh, SS Sastry, SA Seshia Tools and Algorithms for the Construction and Analysis of Systems: 20th …, 2014 | 128 | 2014 |
| Mining assumptions for synthesis W Li, L Dworkin, SA Seshia Ninth ACM/IEEE International Conference on Formal Methods and Models for …, 2011 | 119 | 2011 |
| Reverse engineering circuits using behavioral pattern mining W Li, Z Wasson, SA Seshia 2012 IEEE international symposium on hardware-oriented security and trust, 83-88, 2012 | 115 | 2012 |
| Reachnn: Reachability analysis of neural-network controlled systems C Huang, J Fan, W Li, X Chen, Q Zhu ACM Transactions on Embedded Computing Systems (TECS) 18 (5s), 1-22, 2019 | 110 | 2019 |
| Data-driven probabilistic modeling and verification of human driver behavior D Sadigh, K Driggs-Campbell, A Puggelli, W Li, V Shia, R Bajcsy, ... AAAI Spring Symposium-Technical Report, 56-61, 2014 | 101 | 2014 |
| Physical activity monitoring for assisted living at home R Jafari, W Li, R Bajcsy, S Glaser, S Sastry 4th International Workshop on Wearable and Implantable Body Sensor Networks …, 2007 | 98 | 2007 |
| ARSENAL: automatic requirements specification extraction from natural language S Ghosh, D Elenius, W Li, P Lincoln, N Shankar, W Steiner NASA Formal Methods: 8th International Symposium, NFM 2016, Minneapolis, MN …, 2016 | 90 | 2016 |
| Polynomial-time verification of PCTL properties of MDPs with convex uncertainties A Puggelli, W Li, AL Sangiovanni-Vincentelli, SA Seshia Computer Aided Verification: 25th International Conference, CAV 2013, Saint …, 2013 | 89 | 2013 |
| Wordrev: Finding word-level structures in a sea of bit-level gates W Li, A Gascon, P Subramanyan, WY Tan, A Tiwari, S Malik, N Shankar, ... 2013 IEEE international symposium on hardware-oriented security and trust …, 2013 | 88 | 2013 |
| Design as you see FIT: System-level soft error analysis of sequential circuits D Holcomb, W Li, SA Seshia 2009 Design, Automation & Test in Europe Conference & Exhibition, 785-790, 2009 | 72 | 2009 |
| A theory of mutations with applications to vacuity, coverage, and fault tolerance O Kupferman, W Li, SA Seshia 2008 Formal Methods in Computer-Aided Design, 1-9, 2008 | 50 | 2008 |
| Reachnn*: A tool for reachability analysis of neural-network controlled systems J Fan, C Huang, X Chen, W Li, Q Zhu Automated Technology for Verification and Analysis: 18th International …, 2020 | 40 | 2020 |
| Trojdrl: evaluation of backdoor attacks on deep reinforcement learning P Kiourti, K Wardega, S Jha, W Li 2020 57th ACM/IEEE Design Automation Conference (DAC), 1-6, 2020 | 36 | 2020 |
| Optimizations of an application-level protocol for enhanced dependability in FlexRay W Li, M Di Natale, W Zheng, P Giusto, A Sangiovanni-Vincentelli, ... 2009 Design, Automation & Test in Europe Conference & Exhibition, 1076-1081, 2009 | 34 | 2009 |
| Detecting similar programs via the Weisfeiler-Leman graph kernel W Li, H Saidi, H Sanchez, M Schäf, P Schweitzer Software Reuse: Bridging with Social-Awareness: 15th International …, 2016 | 32 | 2016 |
| Safety-aware apprenticeship learning W Zhou, W Li Computer Aided Verification: 30th International Conference, CAV 2018, Held …, 2018 | 31 | 2018 |
Sanjit A. SeshiaProfessor of EECS, University of California, BerkeleyVerified email at eecs.berkeley.edu
